Metrological Array of Cyber-Physical Systems. Part 7. Additive Error Correction for Measuring Instrument

Since during design it is impossible to use the uncertainty approach because the measurement results are still absent and as noted the error approach that can be successfully applied taking as true the nominal value of instruments transformation function. Limiting possibilities of additive error correction of measuring instruments for Cyber-Physical Systems are studied basing on general and special methods of measurement. Principles of measuring circuit maximal symmetry and its minimal reconfiguration are proposed for measurement or/and calibration. It is theoretically justified for the variety of correction methods that minimum additive error of measuring instruments exists under considering the real equivalent parameters of input electronic switches. Terms of self-calibrating and verification the measuring instruments in place are studied. Copyright © 2015 IFSA Publishing, S. L.